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Description
Product Details
The AD676 is a multipurpose 16-bit parallel output analog-to-digital converter which utilizes a switched-capacitor/charge redistribution architecture to achieve a 100 kSPS conversion rate (10 µs total conversion time). Overall performance is optimized by digitally correcting internal nonlinearities through on-chip autocalibration.
The AD676 circuitry is segmented onto two monolithic chips- a digital control chip fabricated on Analog Devices DSP CMOS process and an analog ADC chip fabricated on our BiMOS II process. Both chips are contained in a single package.
The AD676 is specified for ac (or "dynamic") parameters such as S/(N+D) Ratio, THD and IMD which are important in signal processing applications. In addition, dc parameters are specified which are important in measurement applications.
The AD676 operates from +5 V and ±12 V supplies and typically consumes 360 mW during conversion. The digital supply (VDD ) is separated from the analog supplies (VCC , VEE ) for reduced digital crosstalk. An analog ground sense is provided for the analog input. Separate analog and digital grounds are also provided.
The AD676 is available in a 28-pin plastic DIP or 28-pin side-brazed ceramic package. A serial-output version, the AD677, is available in a 16-pin 300 mil wide ceramic or plastic package.
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(Additional charges ($35-$50) may apply for delivery in these areas)
- Delivery date: usually 2 to 7 working days.
- A tracking number will be sent after your order ships.
- Carefully inspected and packed by ManyChip warehouse
- Vacuum packaging
- Anti-static packaging
- Shockproof foam
The terms here are for reference only, the actual terms are subject to the sales quotation.
- Please confirm product specifications when ordering.
- MOQ refers to the minimum order quantity required to purchase each part.
- If you have special ordering instructions, please indicate them on the ordering page.
- Inspection (PSI) will be performed prior to shipment.
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- Decapsulation control
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- XRF inspection
- Electrical testing
- Surface testing
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