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Description
GENERAL DESCRIPTION
The ADG506A and ADG507A are CMOS monolithic analog multiplexers with 16 channels and dual 8 channels, respectively. The ADG506A switches one of 16 inputs to a common output, depending on the state of four binary addresses and an enable input. The ADG507A switches one of eight differential inputs to a common differential output, depending on the state of three binary addresses and an enable input. Both devices have TTL and 5 V CMOS logic compatible digital inputs.
PRODUCT HIGHLIGHTS
1\. Single/Dual Supply Specifications with a Wide Tolerance
The devices are specified in the 10.8 V to 16.5 V range for both single and dual supplies.
2\. Extended Signal Range
The enhanced LC2MOS processing results in a high break down and an increased analog signal range of VSS to VDD.
3\. Break-Before-Make Switching
Switches are guaranteed break-before-make so input signals are protected against momentary shorting.
4\. Low Leakage
Leakage currents in the range of 20 pA make these multiplexers suitable for high precision circuits.
FEATURES
44 V Supply Maximum Rating
VSS to VDD Analog Signal Range
Single/Dual Supply Specifications
Wide Supply Ranges (10.8 V to 16.5 V)
Extended Plastic Temperature Range (–408C to +858C)
Low Power Dissipation (28 mW max)
Low Leakage (20 pA typ)
Available in 28-Lead DIP, SOIC, PLCC, TSSOP and LCCC Packages
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charges, duties and taxes.
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(Additional charges ($35-$50) may apply for delivery in these areas)
- Delivery date: usually 2 to 7 working days.
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- Carefully inspected and packed by ManyChip warehouse
- Vacuum packaging
- Anti-static packaging
- Shockproof foam
The terms here are for reference only, the actual terms are subject to the sales quotation.
- Please confirm product specifications when ordering.
- MOQ refers to the minimum order quantity required to purchase each part.
- If you have special ordering instructions, please indicate them on the ordering page.
- Inspection (PSI) will be performed prior to shipment.
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- Decapsulation control
- X-ray control
- XRF inspection
- Electrical testing
- Surface testing
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